The Hong Kong Polytechnic University (PolyU) recently developed an intelligent fabric defect detection system, called "WiseEye", which leverages advanced technologies including Artificial Intelligence ...
The chip industry is conservative when it comes to adopting new metrology and inspection. Will it ultimately see NVD inspection as a wunderkind, or an also-ran? Remember when it first became obvious ...
In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
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